Qualcomm Fastconnect 6700 vulnerabilities, page 2
441 vulnerabilities
Known vulnerabilities in Qualcomm Fastconnect 6700, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.
CVE-2025-21432qualcomm, inc.snapdragon+239
EPSS score0.09%
Memory corruption while retrieving the CBOR data from TA.CVE-2025-21481qualcomm, inc.snapdragon+249EPSS score0.07%
Memory corruption while performing private key encryption in trusted application.CVE-2025-21439qualcomm, inc.snapdragon+25EPSS score0.11%
Memory corruption may occur while reading board data via IOCTL call when the WLAN driver copies the content to the provided output buffer.CVE-2025-21459qualcomm, inc.snapdragon+123EPSS score0.34%
Transient DOS while parsing per STA profile in ML IE.CVE-2025-21483qualcomm, inc.snapdragon+225EPSS score0.42%
Memory corruption when the UE receives an RTP packet from the network, during the reassembly of NALUs.CVE-2025-21421qualcomm, inc.snapdragon+45EPSS score0.11%
Memory corruption while processing escape code in API.CVE-2025-21438qualcomm, inc.snapdragon+43EPSS score0.11%
Memory corruption while IOCTL call is invoked from user-space to read board data.CVE-2025-21482qualcomm, inc.snapdragon+287EPSS score0.09%
Cryptographic issue while performing RSA PKCS padding decoding.CVE-2025-21449qualcomm, inc.snapdragon+178EPSS score0.24%
Transient DOS may occur while processing malformed length field in SSID IEs.CVE-2025-21434qualcomm, inc.snapdragon+121EPSS score0.26%
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.CVE-2025-21469qualcomm, inc.snapdragon+20EPSS score0.09%
Memory corruption while processing image encoding, when input buffer length is 0 in IOCTL call.CVE-2025-21470qualcomm, inc.snapdragon+33EPSS score0.09%
Memory corruption while processing image encoding, when configuration is NULL in IOCTL parameter.CVE-2025-21465qualcomm, inc.snapdragon+347EPSS score0.09%
Information disclosure while processing the hash segment in an MBN file.CVE-2025-21423qualcomm, inc.snapdragon+45EPSS score0.11%
Memory corruption occurs when handling client calls to EnableTestMode through an Escape call.CVE-2025-21422qualcomm, inc.snapdragon+215EPSS score0.10%
Cryptographic issue while processing crypto API calls, missing checks may lead to corrupted key usage or IV reuses.CVE-2025-21475qualcomm, inc.snapdragon+40EPSS score0.11%
Memory corruption while processing escape code, when DisplayId is passed with large unsigned value.CVE-2025-21453qualcomm, inc.snapdragon+259EPSS score0.11%
Memory corruption while processing a data structure, when an iterator is accessed after it has been removed, potential failures occur.CVE-2025-21441alpinepy3-urllib3+50EPSS score0.11%
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.CVE-2025-21463qualcomm, inc.snapdragon+210EPSS score0.23%
Transient DOS while processing the EHT operation IE in the received beacon frame.CVE-2025-21488qualcomm, inc.snapdragon+106EPSS score0.27%
Information disclosure while decoding this RTP packet headers received by UE from the network when the padding bit is set.