Qualcomm Ipq5332 vulnerabilities, page 3

94 vulnerabilities

Known vulnerabilities in Qualcomm Ipq5332, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

7.5CVE-2024-33012qualcomm, inc.snapdragon+247
EPSS score
0.28%
Transient DOS while parsing the multiple MBSSID IEs from the beacon, when the tag length is non-zero value but with end of beacon.
7.5CVE-2024-33048qualcomm, inc.snapdragon+187
EPSS score
0.30%
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
7.5CVE-2024-33010qualcomm, inc.snapdragon+246
EPSS score
0.28%
Transient DOS while parsing fragments of MBSSID IE from beacon frame.
7.5CVE-2024-33019qualcomm, inc.snapdragon+148
EPSS score
0.28%
Transient DOS while parsing the received TID-to-link mapping action frame.
8.2CVE-2024-33073qualcomm, inc.snapdragon+158
EPSS score
0.35%
Information disclosure while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
6.8CVE-2024-33016qualcomm, inc.snapdragon+331
EPSS score
0.15%
memory corruption when an invalid firehose patch command is invoked.
7.5CVE-2024-33025qualcomm, inc.snapdragon+167
EPSS score
0.28%
Transient DOS while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
7.5CVE-2024-33063qualcomm, inc.snapdragon+123
EPSS score
0.26%
Transient DOS while parsing the ML IE when a beacon with common info length of the ML IE greater than the ML IE inside which this element is present.
8.4CVE-2024-33056qualcomm, inc.snapdragon+323
EPSS score
0.10%
Memory corruption when allocating and accessing an entry in an SMEM partition continuously.
7.5CVE-2024-33018qualcomm, inc.snapdragon+150
EPSS score
0.33%
Transient DOS while parsing the received TID-to-link mapping element of the TID-to-link mapping action frame.
7.5CVE-2024-33014qualcomm, inc.snapdragon+319
EPSS score
0.32%
Transient DOS while parsing ESP IE from beacon/probe response frame.
7.5CVE-2024-33024qualcomm, inc.snapdragon+179
EPSS score
0.28%
Transient DOS while parsing the ML IE when a beacon with length field inside the common info of ML IE greater than the ML IE length.
7.5CVE-2024-33057qualcomm, inc.snapdragon+170
EPSS score
0.30%
Transient DOS while parsing the multi-link element Control field when common information length check is missing before updating the location.
7.5CVE-2024-33015qualcomm, inc.snapdragon+192
EPSS score
0.28%
Transient DOS while parsing SCAN RNR IE when bytes received from AP is such that the size of the last param of IE is less than neighbor report.
7.5CVE-2024-33049qualcomm, inc.snapdragon+131
EPSS score
0.32%
Transient DOS while parsing noninheritance IE of Extension element when length of IE is 2 of beacon frame.
7.5CVE-2024-33013qualcomm, inc.snapdragon+169
EPSS score
0.28%
Transient DOS when driver accesses the ML IE memory and offset value is incremented beyond ML IE length.
7.8CVE-2024-23368qualcomm, inc.snapdragon+341
EPSS score
0.10%
Memory corruption when allocating and accessing an entry in an SMEM partition.
7.5CVE-2024-23363qualcomm, inc.snapdragon+124
EPSS score
0.26%
Transient DOS while processing an improperly formatted Fine Time Measurement (FTM) management frame.
7.5CVE-2024-23364qualcomm, inc.snapdragon+177
EPSS score
0.30%
Transient DOS when processing the non-transmitted BSSID profile sub-elements present within the MBSSID Information Element (IE) of a beacon frame that is received from over-the-air (OTA).
7.5CVE-2026-25275qualcomm, inc.snapdragon+369
EPSS score
0.19%
Transient DOS when processing authentication frames with invalid FILS information element header lengths.