Qualcomm Iqx5121 vulnerabilities

28 vulnerabilities

Known vulnerabilities in Qualcomm Iqx5121, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

6.7CVE-2025-59611qualcomm, inc.snapdragon+50
EPSS score
0.08%
Memory corruption in diagnostic services due to absence of input validation
6.7CVE-2025-59612qualcomm, inc.snapdragon+31
EPSS score
0.08%
Memory corruption in windows drivers while sending incorrect trusted application request
7.8CVE-2025-59604qualcomm, inc.snapdragon+258
EPSS score
0.07%
Memory Corruption when running a memory copy operation due to invalid writes caused by a null pointer.
6.7CVE-2025-59613qualcomm, inc.snapdragon+44
EPSS score
0.08%
Memory Corruption when output buffer size is smaller than input buffer size during data copying operation.
6.7CVE-2025-59614qualcomm, inc.snapdragon+21
EPSS score
0.08%
Memory Corruption when sending random number generator command with insufficient output buffer size.
7.5CVE-2025-47401qualcomm, inc.snapdragon+241
EPSS score
0.22%
Transient DOS when processing target power rate tables during channel configuration.
7.5CVE-2025-47403qualcomm, inc.snapdragon+254
EPSS score
0.22%
Transient DOS when processing a malformed Fast Transition response frame with an invalid header structure during wireless roaming.
7.8CVE-2025-47408qualcomm, inc.snapdragon+20
EPSS score
0.07%
Memory corruption when another driver calls an IOCTL with invalid input/output buffer.
7.8CVE-2025-47405qualcomm, inc.snapdragon+16
EPSS score
0.07%
Memory corruption when processing camera sensor input/output control codes with invalid output buffers.
6.1CVE-2025-47406qualcomm, inc.snapdragon+31
EPSS score
0.07%
Information Disclosure while processing IOCTL handler callbacks without verifying buffer size.
7.8CVE-2026-21379qualcomm, inc.snapdragon+47
EPSS score
0.10%
Memory Corruption when allocating memory with sizes that exceed the maximum allowed value.
7.8CVE-2026-25271qualcomm, inc.snapdragon+21
EPSS score
0.07%
Memory Corruption when processing asynchronous input parameters due to improper handling of modified values between check and use.
7.8CVE-2026-25261qualcomm, inc.snapdragon+24
EPSS score
0.07%
Memory corruption while processing rear sensor IOCTL calls.
7.8CVE-2026-25280qualcomm, inc.snapdragon+20
EPSS score
0.07%
Memory corruption when processing escape handling flow with insufficient user buffer sizes.
7.5CVE-2026-25275qualcomm, inc.snapdragon+369
EPSS score
0.19%
Transient DOS when processing authentication frames with invalid FILS information element header lengths.
7.8CVE-2026-25258qualcomm, inc.snapdragon+21
EPSS score
0.07%
Memory corruption while processing IOCTL calls for escape operations.
7.8CVE-2026-25267qualcomm, inc.snapdragon+160
EPSS score
0.06%
Memory corruption when non-secure loader rewrites page tables before secure memory initialization.
7.1CVE-2026-25302qualcomm, inc.snapdragon+285
EPSS score
0.06%
Cryptographic Issue when processing non-ELF partitions, authentication and signature checks are bypassed, allowing unsigned or corrupted images to be mounted and processed.
6.6CVE-2026-25263qualcomm, inc.snapdragon+160
EPSS score
0.06%
Memory corruption while processing IOCTL command called from user space to the kernel with invalid parameters.
6.7CVE-2026-25274qualcomm, inc.snapdragon+45
EPSS score
0.07%
Memory Corruption when processing concurrent DMA buffer allocation and deallocation commands without proper synchronization.