Qualcomm Qca0000 vulnerabilities, page 4

139 vulnerabilities

Known vulnerabilities in Qualcomm Qca0000, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

9.8CVE-2024-49839qualcomm, inc.snapdragon+185
EPSS score
0.29%
Memory corruption during management frame processing due to mismatch in T2LM info element.
7.5CVE-2024-33026qualcomm, inc.snapdragon+164
EPSS score
0.28%
Transient DOS while parsing probe response and assoc response frame when received frame length is less than max size of timestamp.
7.5CVE-2024-33050qualcomm, inc.snapdragon+252
EPSS score
0.30%
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
7.5CVE-2024-33048qualcomm, inc.snapdragon+187
EPSS score
0.30%
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
8.2CVE-2024-33073qualcomm, inc.snapdragon+158
EPSS score
0.35%
Information disclosure while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
6.8CVE-2024-33016qualcomm, inc.snapdragon+331
EPSS score
0.15%
memory corruption when an invalid firehose patch command is invoked.
7.5CVE-2024-33025qualcomm, inc.snapdragon+167
EPSS score
0.28%
Transient DOS while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
7.5CVE-2024-33063qualcomm, inc.snapdragon+123
EPSS score
0.26%
Transient DOS while parsing the ML IE when a beacon with common info length of the ML IE greater than the ML IE inside which this element is present.
8.4CVE-2024-33056qualcomm, inc.snapdragon+323
EPSS score
0.10%
Memory corruption when allocating and accessing an entry in an SMEM partition continuously.
7.5CVE-2024-33014qualcomm, inc.snapdragon+319
EPSS score
0.32%
Transient DOS while parsing ESP IE from beacon/probe response frame.
7.5CVE-2024-33024qualcomm, inc.snapdragon+179
EPSS score
0.28%
Transient DOS while parsing the ML IE when a beacon with length field inside the common info of ML IE greater than the ML IE length.
7.5CVE-2024-33057qualcomm, inc.snapdragon+170
EPSS score
0.30%
Transient DOS while parsing the multi-link element Control field when common information length check is missing before updating the location.
7.8CVE-2024-23368qualcomm, inc.snapdragon+341
EPSS score
0.10%
Memory corruption when allocating and accessing an entry in an SMEM partition.
7.5CVE-2024-23363qualcomm, inc.snapdragon+124
EPSS score
0.26%
Transient DOS while processing an improperly formatted Fine Time Measurement (FTM) management frame.
7.8CVE-2026-21373qualcomm, inc.snapdragon+54
EPSS score
0.08%
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing.
7.8CVE-2026-21380qualcomm, inc.snapdragon+23
EPSS score
0.07%
Memory Corruption when using deprecated DMABUF IOCTL calls to manage video memory.
7.8CVE-2026-21376qualcomm, inc.snapdragon+54
EPSS score
0.10%
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing in a camera sensor driver.
7.8CVE-2026-21378qualcomm, inc.snapdragon+51
EPSS score
0.07%
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing in a camera sensor driver.
7.8CVE-2026-21374qualcomm, inc.snapdragon+54
EPSS score
0.11%
Memory Corruption when processing auxiliary sensor input/output control commands with insufficient buffer size validation.
7.8CVE-2026-21371qualcomm, inc.snapdragon+52
EPSS score
0.10%
Memory Corruption when retrieving output buffer with insufficient size validation.