Qualcomm Qcn6102 vulnerabilities

77 vulnerabilities

Known vulnerabilities in Qualcomm Qcn6102, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

7.8CVE-2021-35129qualcomm, inc.snapdragon compute, snapdragon connectivity, snapdragon consumer electronics connectivity, snapdragon industrial iot, snapdragon mobile, snapdragon wired infrastructure and networking+45
EPSS score
0.16%
Memory corruption in BT controller due to improper length check while processing vendor specific commands in Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer Electronics Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wired Infrastructure and Networking
9.1CVE-2021-35088qualcommaqt1000_firmware+184
EPSS score
0.85%
Possible out of bound read due to improper validation of IE length during SSID IE parse when channel is DFS in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking
7.8CVE-2021-35069qualcommapq8096au_firmware+190
EPSS score
0.18%
Improper validation of data length received from DMA buffer can lead to memory corruption. in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wired Infrastructure and Networking
7.8CVE-2021-35103qualcomm, inc.snapdragon auto, snapdragon compute, snapdragon connectivity, snapdragon industrial iot, snapdragon mobile, snapdragon wearables, snapdragon wired infrastructure and networking+149
EPSS score
0.20%
Possible out of bound write due to improper validation of number of timer values received from firmware while syncing timers in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking
5.5CVE-2021-35071qualcomm, inc.snapdragon auto, snapdragon compute, snapdragon connectivity, snapdragon industrial iot, snapdragon mobile, snapdragon wearables, snapdragon wired infrastructure and networking+171
EPSS score
0.14%
Possible buffer over read due to lack of size validation while copying data from DBR buffer to RX buffer and can lead to Denial of Service in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking
7.5CVE-2025-21448qualcomm, inc.snapdragon+267
EPSS score
0.26%
Transient DOS may occur while parsing SSID in action frames.
7.5CVE-2025-21446qualcomm, inc.snapdragon+235
EPSS score
0.24%
Transient DOS may occur when processing vendor-specific information elements while parsing a WLAN frame for BTM requests.
7.5CVE-2025-47318qualcomm, inc.snapdragon+202
EPSS score
0.21%
Transient DOS while parsing the EPTM test control message to get the test pattern.
6.1CVE-2025-47331qualcomm, inc.snapdragon+297
EPSS score
0.08%
Information disclosure while processing a firmware event.
7.8CVE-2025-27061qualcomm, inc.snapdragon+337
EPSS score
0.10%
Memory corruption whhile handling the subsystem failure memory during the parsing of video packets received from the video firmware.
6.5CVE-2025-27040qualcomm, inc.snapdragon+65
EPSS score
0.08%
Information disclosure may occur while processing the hypervisor log.
7.8CVE-2025-27042qualcomm, inc.snapdragon+337
EPSS score
0.09%
Memory corruption while processing video packets received from video firmware.
8.8CVE-2025-27060qualcomm, inc.snapdragon+25
EPSS score
0.09%
Memory corruption while performing SCM call with malformed inputs.
8.8CVE-2025-27059qualcomm, inc.snapdragon+25
EPSS score
0.09%
Memory corruption while performing SCM call.
8.8CVE-2025-27074qualcomm, inc.snapdragon+95
EPSS score
0.09%
Memory corruption while processing a GP command response.
7.5CVE-2025-27066qualcomm, inc.snapdragon+370
EPSS score
0.28%
Transient DOS while processing an ANQP message.
7.5CVE-2022-40512qualcomm, inc.snapdragon+295
EPSS score
0.42%
Transient DOS in WLAN Firmware due to buffer over-read while processing probe response or beacon.
7.5CVE-2022-40527qualcomm, inc.snapdragon+99
EPSS score
0.41%
Transient DOS due to reachable assertion in WLAN while processing PEER ID populated by TQM.
9.8CVE-2022-40514qualcomm, inc.snapdragon+228
EPSS score
0.47%
Memory corruption due to buffer copy without checking the size of input in WLAN Firmware while processing CCKM IE in reassoc response frame.
8.4CVE-2022-40532qualcomm, inc.snapdragon+353
EPSS score
0.12%
Memory corruption due to integer overflow or wraparound in WLAN while sending WMI cmd from host to target.