Qualcomm Qcn6432 vulnerabilities, page 2

70 vulnerabilities

Known vulnerabilities in Qualcomm Qcn6432, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

7.5CVE-2024-21477qualcomm, inc.snapdragon+182
EPSS score
0.32%
Transient DOS while parsing a protected 802.11az Fine Time Measurement (FTM) frame.
7.5CVE-2024-21457qualcomm, inc.snapdragon+111
EPSS score
0.21%
INformation disclosure while handling Multi-link IE in beacon frame.
7.5CVE-2024-21459qualcomm, inc.snapdragon+175
EPSS score
0.26%
Information disclosure while handling beacon or probe response frame in STA.
7.1CVE-2024-21462qualcomm, inc.snapdragon+309
EPSS score
0.09%
Transient DOS while loading the TA ELF file.
7.5CVE-2024-21467qualcomm, inc.snapdragon+129
EPSS score
0.26%
Information disclosure while handling beacon probe frame during scan entry generation in client side.
5.5CVE-2024-43046qualcomm, inc.snapdragon+308
EPSS score
0.11%
There may be information disclosure during memory re-allocation in TZ Secure OS.
7.8CVE-2024-43057qualcomm, inc.snapdragon+151
EPSS score
0.12%
Memory corruption while processing command in Glink linux.
7.5CVE-2024-38397qualcomm, inc.snapdragon+115
EPSS score
0.32%
Transient DOS while parsing probe response and assoc response frame.
6.5CVE-2024-45556qualcomm, inc.snapdragon+60
EPSS score
0.09%
Cryptographic issue may arise because the access control configuration permits Linux to read key registers in TCSR.
7.5CVE-2024-45558qualcomm, inc.snapdragon+182
EPSS score
0.38%
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
9.8CVE-2024-45569qualcomm, inc.snapdragon+173
EPSS score
0.58%
Memory corruption while parsing the ML IE due to invalid frame content.
7.8CVE-2024-45571qualcomm, inc.snapdragon+150
EPSS score
0.10%
Memory corruption may occour occur when stopping the WLAN interface after processing a WMI command from the interface.
9.8CVE-2024-49839qualcomm, inc.snapdragon+185
EPSS score
0.29%
Memory corruption during management frame processing due to mismatch in T2LM info element.
7.5CVE-2024-33026qualcomm, inc.snapdragon+164
EPSS score
0.28%
Transient DOS while parsing probe response and assoc response frame when received frame length is less than max size of timestamp.
7.5CVE-2024-33011qualcomm, inc.snapdragon+247
EPSS score
0.28%
Transient DOS while parsing the MBSSID IE from the beacons, when the MBSSID IE length is zero.
9.8CVE-2024-33066qualcomm, inc.snapdragon+71
EPSS score
0.60%
Memory corruption while redirecting log file to any file location with any file name.
7.5CVE-2024-33068qualcomm, inc.snapdragon+121
EPSS score
0.25%
Transient DOS while parsing fragments of MBSSID IE from beacon frame.
7.5CVE-2024-33050qualcomm, inc.snapdragon+252
EPSS score
0.30%
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
7.5CVE-2024-33012qualcomm, inc.snapdragon+247
EPSS score
0.28%
Transient DOS while parsing the multiple MBSSID IEs from the beacon, when the tag length is non-zero value but with end of beacon.
7.5CVE-2024-33048qualcomm, inc.snapdragon+187
EPSS score
0.30%
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.