Qualcomm Sc8380Xp vulnerabilities

257 vulnerabilities

Known vulnerabilities in Qualcomm Sc8380Xp, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

7.8CVE-2025-21466qualcomm, inc.snapdragon+40
EPSS score
0.10%
Memory corruption while processing a private escape command in an event trigger.
7.8CVE-2025-21447qualcomm, inc.snapdragon+8
EPSS score
0.11%
Memory corruption may occur while processing device IO control call for session control.
8.6CVE-2025-21480qualcomm, inc.snapdragon+75KEV
EPSS score
0.46%
Memory corruption due to unauthorized command execution in GPU micronode while executing specific sequence of commands.
7.8CVE-2025-21440qualcomm, inc.snapdragon+49
EPSS score
0.11%
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
6.2CVE-2025-21433qualcomm, inc.snapdragon+268
EPSS score
0.09%
Transient DOS when importing a PKCS#8-encoded RSA private key with a zero-sized modulus.
6.5CVE-2025-21464qualcomm, inc.snapdragon+340
EPSS score
0.09%
Information disclosure while reading data from an image using specified offset and size parameters.
7.5CVE-2025-21454qualcomm, inc.snapdragon+185
EPSS score
0.24%
Transient DOS while processing received beacon frame.
7.5CVE-2025-21448qualcomm, inc.snapdragon+267
EPSS score
0.26%
Transient DOS may occur while parsing SSID in action frames.
7.5CVE-2025-21446qualcomm, inc.snapdragon+235
EPSS score
0.24%
Transient DOS may occur when processing vendor-specific information elements while parsing a WLAN frame for BTM requests.
7.8CVE-2025-21432qualcomm, inc.snapdragon+239
EPSS score
0.09%
Memory corruption while retrieving the CBOR data from TA.
7.8CVE-2025-21481qualcomm, inc.snapdragon+249
EPSS score
0.07%
Memory corruption while performing private key encryption in trusted application.
7.8CVE-2025-21462qualcomm, inc.snapdragon+13
EPSS score
0.11%
Memory corruption while processing an IOCTL request, when buffer significantly exceeds the command argument limit.
7.8CVE-2025-21421qualcomm, inc.snapdragon+45
EPSS score
0.11%
Memory corruption while processing escape code in API.
7.8CVE-2025-21438qualcomm, inc.snapdragon+43
EPSS score
0.11%
Memory corruption while IOCTL call is invoked from user-space to read board data.
7.1CVE-2025-21482qualcomm, inc.snapdragon+287
EPSS score
0.09%
Cryptographic issue while performing RSA PKCS padding decoding.
7.5CVE-2025-21449qualcomm, inc.snapdragon+178
EPSS score
0.24%
Transient DOS may occur while processing malformed length field in SSID IEs.
7.8CVE-2025-21469qualcomm, inc.snapdragon+20
EPSS score
0.09%
Memory corruption while processing image encoding, when input buffer length is 0 in IOCTL call.
7.8CVE-2025-21470qualcomm, inc.snapdragon+33
EPSS score
0.09%
Memory corruption while processing image encoding, when configuration is NULL in IOCTL parameter.
6.5CVE-2025-21465qualcomm, inc.snapdragon+347
EPSS score
0.09%
Information disclosure while processing the hash segment in an MBN file.
7.8CVE-2025-21423qualcomm, inc.snapdragon+45
EPSS score
0.11%
Memory corruption occurs when handling client calls to EnableTestMode through an Escape call.