Qualcomm Snapdragon 7C Gen 2 Compute Platform vulnerabilities

48 vulnerabilities

Known vulnerabilities in Qualcomm Snapdragon 7C Gen 2 Compute Platform, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

6.7CVE-2025-59611qualcomm, inc.snapdragon+50
EPSS score
0.08%
Memory corruption in diagnostic services due to absence of input validation
8.8CVE-2025-47392qualcomm, inc.snapdragon+148
EPSS score
0.17%
Memory corruption when decoding corrupted satellite data files with invalid signature offsets.
7.2CVE-2025-47383qualcomm, inc.snapdragon+200
EPSS score
0.14%
Weak configuration may lead to cryptographic issue when a VoWiFi call is triggered from UE.
6.5CVE-2025-47371qualcomm, inc.snapdragon+122
EPSS score
0.10%
Transient DOS when an LTE RLC packet with invalid TB is received by UE.
8.4CVE-2024-21470qualcomm, inc.snapdragon+33
EPSS score
0.11%
Memory corruption while allocating memory for graphics.
7.8CVE-2024-45542qualcomm, inc.snapdragon+51
EPSS score
0.13%
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
7.8CVE-2024-45541qualcomm, inc.snapdragon+51
EPSS score
0.11%
Memory corruption when IOCTL call is invoked from user-space to read board data.
8.4CVE-2024-33044qualcomm, inc.snapdragon+208
EPSS score
0.10%
Memory corruption while Configuring the SMR/S2CR register in Bypass mode.
8.4CVE-2024-33056qualcomm, inc.snapdragon+323
EPSS score
0.10%
Memory corruption when allocating and accessing an entry in an SMEM partition continuously.
7.8CVE-2026-21373qualcomm, inc.snapdragon+54
EPSS score
0.08%
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing.
7.8CVE-2026-21376qualcomm, inc.snapdragon+54
EPSS score
0.10%
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing in a camera sensor driver.
7.8CVE-2026-21378qualcomm, inc.snapdragon+51
EPSS score
0.07%
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing in a camera sensor driver.
7.8CVE-2026-21374qualcomm, inc.snapdragon+54
EPSS score
0.11%
Memory Corruption when processing auxiliary sensor input/output control commands with insufficient buffer size validation.
7.8CVE-2026-21371qualcomm, inc.snapdragon+52
EPSS score
0.10%
Memory Corruption when retrieving output buffer with insufficient size validation.
7.5CVE-2026-25275qualcomm, inc.snapdragon+369
EPSS score
0.19%
Transient DOS when processing authentication frames with invalid FILS information element header lengths.
7.8CVE-2026-25267qualcomm, inc.snapdragon+160
EPSS score
0.06%
Memory corruption when non-secure loader rewrites page tables before secure memory initialization.
6.6CVE-2026-25263qualcomm, inc.snapdragon+160
EPSS score
0.06%
Memory corruption while processing IOCTL command called from user space to the kernel with invalid parameters.
7.8CVE-2026-24075qualcomm, inc.snapdragon+43
EPSS score
0.06%
Memory Corruption when multiple threads issue concurrent IOCTL requests to the device control handler due to improper synchronization and race conditions.
6.7CVE-2026-24076qualcomm, inc.snapdragon+52
EPSS score
0.11%
Memory Corruption when processing registry values with incorrect types using a direct query method.
7.8CVE-2026-24074qualcomm, inc.snapdragon+25
EPSS score
0.07%
Memory Corruption when processing data with large offset and length values exceeds buffer limits during data copy operations.