Qualcomm Snapdragon 8 Gen 3 Mobile vulnerabilities, page 3

90 vulnerabilities

Known vulnerabilities in Qualcomm Snapdragon 8 Gen 3 Mobile, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

7.8CVE-2024-45584qualcomm, inc.snapdragon+122
EPSS score
0.10%
Memory corruption can occur when a compat IOCTL call is followed by a normal IOCTL call from userspace.
9.8CVE-2024-45569qualcomm, inc.snapdragon+173
EPSS score
0.58%
Memory corruption while parsing the ML IE due to invalid frame content.
7.8CVE-2024-45583qualcomm, inc.snapdragon+7
EPSS score
0.11%
Memory corruption while handling multiple IOCTL calls from userspace to operate DMA operations.
7.8CVE-2024-45571qualcomm, inc.snapdragon+150
EPSS score
0.10%
Memory corruption may occour occur when stopping the WLAN interface after processing a WMI command from the interface.
7.8CVE-2024-45553qualcomm, inc.snapdragon+125
EPSS score
0.13%
Memory corruption can occur when process-specific maps are added to the global list. If a map is removed from the global list while another thread is using it for a process-specific task, issues may arise.
7.8CVE-2024-49834qualcomm, inc.snapdragon+122
EPSS score
0.11%
Memory corruption while power-up or power-down sequence of the camera sensor.
7.8CVE-2024-49843qualcomm, inc.snapdragon+51
EPSS score
0.11%
Memory corruption while processing IOCTL from user space to handle GPU AHB bus error.
9.8CVE-2024-49839qualcomm, inc.snapdragon+185
EPSS score
0.29%
Memory corruption during management frame processing due to mismatch in T2LM info element.
7.8CVE-2024-49845qualcomm, inc.snapdragon+144
EPSS score
0.11%
Memory corruption during the FRS UDS generation process.
7.8CVE-2024-49835qualcomm, inc.snapdragon+207
EPSS score
0.11%
Memory corruption while reading secure file.
7.8CVE-2024-49844qualcomm, inc.snapdragon+179
EPSS score
0.11%
Memory corruption while triggering commands in the PlayReady Trusted application.
8.2CVE-2024-49838qualcomm, inc.snapdragon+165
EPSS score
0.31%
Information disclosure while parsing the OCI IE with invalid length.
7.8CVE-2024-49832qualcomm, inc.snapdragon+25
EPSS score
0.10%
Memory corruption in Camera due to unusually high number of nodes passed to AXI port.
7.5CVE-2024-49847qualcomm, inc.snapdragon+47
EPSS score
0.26%
Transient DOS while processing of a registration acceptance OTA due to incorrect ciphering key data IE.
7.8CVE-2024-49841qualcomm, inc.snapdragon+170
EPSS score
0.11%
Memory corruption during memory assignment to headless peripheral VM due to incorrect error code handling.
7.8CVE-2024-49833qualcomm, inc.snapdragon+78
EPSS score
0.10%
Memory corruption can occur in the camera when an invalid CID is used.
7.8CVE-2024-49842qualcomm, inc.snapdragon+176
EPSS score
0.09%
Memory corruption during memory mapping into protected VM address space due to incorrect API restrictions.
7.8CVE-2024-33041qualcomm, inc.snapdragon+34
EPSS score
0.13%
Memory corruption when input parameter validation for number of fences is missing for fence frame IOCTL calls,
7.8CVE-2024-33055qualcomm, inc.snapdragon+38
EPSS score
0.10%
Memory corruption while invoking IOCTL calls to unmap the DMA buffers.
7.5CVE-2024-33048qualcomm, inc.snapdragon+187
EPSS score
0.30%
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.