Qualcomm Snapdragon 8 Gen 3 Mobile Platform vulnerabilities

176 vulnerabilities

Known vulnerabilities in Qualcomm Snapdragon 8 Gen 3 Mobile Platform, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

8.6CVE-2025-21479qualcomm, inc.snapdragon+74KEV
EPSS score
0.84%
Memory corruption due to unauthorized command execution in GPU micronode while executing specific sequence of commands.
8.2CVE-2025-21487qualcomm, inc.snapdragon+225
EPSS score
0.26%
Information disclosure while decoding RTP packet received by UE from the network, when payload length mentioned is greater than the available buffer length.
8.2CVE-2025-21484qualcomm, inc.snapdragon+173
EPSS score
0.26%
Information disclosure when UE receives the RTP packet from the network, while decoding and reassembling the fragments from RTP packet.
7.5CVE-2025-21429qualcomm, inc.snapdragon+182
EPSS score
0.26%
Memory corruption occurs while connecting a STA to an AP and initiating an ADD TS request.
8.6CVE-2025-21480qualcomm, inc.snapdragon+75KEV
EPSS score
0.46%
Memory corruption due to unauthorized command execution in GPU micronode while executing specific sequence of commands.
6.5CVE-2025-21464qualcomm, inc.snapdragon+340
EPSS score
0.09%
Information disclosure while reading data from an image using specified offset and size parameters.
7.5CVE-2025-21430qualcomm, inc.snapdragon+223
EPSS score
0.26%
Transient DOS while connecting STA to AP and initiating ADD TS request from AP to establish TSpec session.
7.5CVE-2025-21448qualcomm, inc.snapdragon+267
EPSS score
0.26%
Transient DOS may occur while parsing SSID in action frames.
7.8CVE-2025-21436qualcomm, inc.snapdragon+25
EPSS score
0.11%
Memory corruption may occur while initiating two IOCTL calls simultaneously to create processes from two different threads.
7.8CVE-2025-21461qualcomm, inc.snapdragon+24
EPSS score
0.09%
Memory corruption when programming registers through virtual CDM.
7.5CVE-2025-21477qualcomm, inc.snapdragon+87
EPSS score
0.22%
Transient DOS while processing CCCH data when NW sends data with invalid length.
7.8CVE-2025-21481qualcomm, inc.snapdragon+249
EPSS score
0.07%
Memory corruption while performing private key encryption in trusted application.
7.5CVE-2025-21435qualcomm, inc.snapdragon+149
EPSS score
0.26%
Transient DOS may occur while parsing extended IE in beacon.
9.8CVE-2025-21483qualcomm, inc.snapdragon+225
EPSS score
0.42%
Memory corruption when the UE receives an RTP packet from the network, during the reassembly of NALUs.
7.8CVE-2025-21485qualcomm, inc.snapdragon+29
EPSS score
0.08%
Memory corruption while processing INIT and multimode invoke IOCTL calls on FastRPC.
7.5CVE-2025-21434qualcomm, inc.snapdragon+121
EPSS score
0.26%
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.
6.5CVE-2025-21465qualcomm, inc.snapdragon+347
EPSS score
0.09%
Information disclosure while processing the hash segment in an MBN file.
7.5CVE-2025-21463qualcomm, inc.snapdragon+210
EPSS score
0.23%
Transient DOS while processing the EHT operation IE in the received beacon frame.
8.2CVE-2025-21488qualcomm, inc.snapdragon+106
EPSS score
0.27%
Information disclosure while decoding this RTP packet headers received by UE from the network when the padding bit is set.
5.5CVE-2025-59609qualcomm, inc.snapdragon+186
EPSS score
0.09%
Information Disclosure when processing advertisement frames with malformed MBSSID elements of insufficient length.