Qualcomm Snapdragon Ar1 Gen 1 Platform vulnerabilities

97 vulnerabilities

Known vulnerabilities in Qualcomm Snapdragon Ar1 Gen 1 Platform, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

6.5CVE-2025-21464qualcomm, inc.snapdragon+340
EPSS score
0.09%
Information disclosure while reading data from an image using specified offset and size parameters.
7.5CVE-2025-21430qualcomm, inc.snapdragon+223
EPSS score
0.26%
Transient DOS while connecting STA to AP and initiating ADD TS request from AP to establish TSpec session.
7.5CVE-2025-21448qualcomm, inc.snapdragon+267
EPSS score
0.26%
Transient DOS may occur while parsing SSID in action frames.
7.8CVE-2025-21426qualcomm, inc.snapdragon+10
EPSS score
0.10%
Memory corruption while processing camera TPG write request.
7.1CVE-2025-21482qualcomm, inc.snapdragon+287
EPSS score
0.09%
Cryptographic issue while performing RSA PKCS padding decoding.
7.5CVE-2025-21434qualcomm, inc.snapdragon+121
EPSS score
0.26%
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.
6.5CVE-2025-21465qualcomm, inc.snapdragon+347
EPSS score
0.09%
Information disclosure while processing the hash segment in an MBN file.
7.5CVE-2025-21463qualcomm, inc.snapdragon+210
EPSS score
0.23%
Transient DOS while processing the EHT operation IE in the received beacon frame.
5.5CVE-2025-59609qualcomm, inc.snapdragon+186
EPSS score
0.09%
Information Disclosure when processing advertisement frames with malformed MBSSID elements of insufficient length.
7.8CVE-2025-59600qualcomm, inc.snapdragon+162
EPSS score
0.08%
Memory Corruption when adding user-supplied data without checking available buffer space.
7.3CVE-2025-59617qualcomm, inc.snapdragon+48
EPSS score
0.09%
Memory Corruption when processing multiple IOCTL calls with the same buffer file descriptor input.
7.8CVE-2025-59604qualcomm, inc.snapdragon+258
EPSS score
0.07%
Memory Corruption when running a memory copy operation due to invalid writes caused by a null pointer.
6.5CVE-2025-59601qualcomm, inc.snapdragon+8
EPSS score
0.11%
Information Disclosure when resetting device to factory default settings through powerline interface allows unauthorized access to device configuration.
6.4CVE-2025-59610qualcomm, inc.snapdragon+229
EPSS score
0.06%
Memory Corruption when processing IOCTL requests with mismatched API versions due to concurrent modification of user-space buffer.
7.8CVE-2025-59615qualcomm, inc.snapdragon+60
EPSS score
0.09%
Memory Corruption when invoking device input/output control operations for mapping and unmapping persistent memory buffers due to improper synchronization.
6.7CVE-2025-59613qualcomm, inc.snapdragon+44
EPSS score
0.08%
Memory Corruption when output buffer size is smaller than input buffer size during data copying operation.
7.8CVE-2025-59605qualcomm, inc.snapdragon+134
EPSS score
0.07%
Memory Corruption when processing device identifier strings that exceed the expected maximum length.
7.8CVE-2025-59616qualcomm, inc.snapdragon+48
EPSS score
0.09%
Memory Corruption when processing multiple IOCTL calls with the same buffer file descriptor input due to accessing already freed memory.
7.8CVE-2025-47396qualcomm, inc.snapdragon+45
EPSS score
0.08%
Memory corruption occurs when a secure application is launched on a device with insufficient memory.
7.5CVE-2025-47318qualcomm, inc.snapdragon+202
EPSS score
0.21%
Transient DOS while parsing the EPTM test control message to get the test pattern.