Qualcomm Snapdragon Ar2 Gen 1 vulnerabilities, page 2

71 vulnerabilities

Known vulnerabilities in Qualcomm Snapdragon Ar2 Gen 1, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

7.8CVE-2024-53024qualcomm, inc.snapdragon+161
EPSS score
0.12%
Memory corruption in display driver while detaching a device.
7.8CVE-2024-53014qualcomm, inc.snapdragon+244
EPSS score
0.12%
Memory corruption may occur while validating ports and channels in Audio driver.
7.8CVE-2024-38402qualcomm, inc.snapdragon+163
EPSS score
0.16%
Memory corruption while processing IOCTL call for getting group info.
8.8CVE-2024-38420qualcomm, inc.snapdragon+157
EPSS score
0.10%
Memory corruption while configuring a Hypervisor based input virtual device.
7.8CVE-2024-45553qualcomm, inc.snapdragon+125
EPSS score
0.13%
Memory corruption can occur when process-specific maps are added to the global list. If a map is removed from the global list while another thread is using it for a process-specific task, issues may arise.
7.8CVE-2024-45580qualcomm, inc.snapdragon+37
EPSS score
0.12%
Memory corruption while handling multuple IOCTL calls from userspace for remote invocation.
7.8CVE-2024-49834qualcomm, inc.snapdragon+122
EPSS score
0.11%
Memory corruption while power-up or power-down sequence of the camera sensor.
9.8CVE-2024-49839qualcomm, inc.snapdragon+185
EPSS score
0.29%
Memory corruption during management frame processing due to mismatch in T2LM info element.
8.2CVE-2024-49838qualcomm, inc.snapdragon+165
EPSS score
0.31%
Information disclosure while parsing the OCI IE with invalid length.
7.8CVE-2024-49841qualcomm, inc.snapdragon+170
EPSS score
0.11%
Memory corruption during memory assignment to headless peripheral VM due to incorrect error code handling.
7.8CVE-2024-49833qualcomm, inc.snapdragon+78
EPSS score
0.10%
Memory corruption can occur in the camera when an invalid CID is used.
7.8CVE-2024-49842qualcomm, inc.snapdragon+176
EPSS score
0.09%
Memory corruption during memory mapping into protected VM address space due to incorrect API restrictions.
7.5CVE-2024-33051qualcomm, inc.snapdragon+282
EPSS score
0.30%
Transient DOS while processing TIM IE from beacon frame as there is no check for IE length.
8.4CVE-2024-33045qualcomm, inc.snapdragon+175
EPSS score
0.12%
Memory corruption when BTFM client sends new messages over Slimbus to ADSP.
7.5CVE-2024-33050qualcomm, inc.snapdragon+252
EPSS score
0.30%
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
7.8CVE-2024-33055qualcomm, inc.snapdragon+38
EPSS score
0.10%
Memory corruption while invoking IOCTL calls to unmap the DMA buffers.
7.5CVE-2024-33048qualcomm, inc.snapdragon+187
EPSS score
0.30%
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
8.4CVE-2024-33060qualcomm, inc.snapdragon+243
EPSS score
0.17%
Memory corruption when two threads try to map and unmap a single node simultaneously.
7.8CVE-2024-33038qualcomm, inc.snapdragon+43
EPSS score
0.10%
Memory corruption while passing untrusted/corrupted pointers from DSP to EVA.
7.5CVE-2024-33057qualcomm, inc.snapdragon+170
EPSS score
0.30%
Transient DOS while parsing the multi-link element Control field when common information length check is missing before updating the location.