Qualcomm Snapdragon Xr2\+ Gen 1 Platform vulnerabilities, page 4

154 vulnerabilities

Known vulnerabilities in Qualcomm Snapdragon Xr2\+ Gen 1 Platform, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

9.1CVE-2024-38408qualcomm, inc.snapdragon+229
EPSS score
0.14%
Cryptographic issue when a controller receives an LMP start encryption command under unexpected conditions.
7.7CVE-2024-45549qualcomm, inc.snapdragon+158
EPSS score
0.12%
Information disclosure while creating MQ channels.
6.2CVE-2024-45551qualcomm, inc.snapdragon+240
EPSS score
0.11%
Cryptographic issue occurs during PIN/password verification using Gatekeeper, where RPMB writes can be dropped on verification failure, potentially leading to a user throttling bypass.
8.4CVE-2024-33044qualcomm, inc.snapdragon+208
EPSS score
0.10%
Memory corruption while Configuring the SMR/S2CR register in Bypass mode.
5.5CVE-2024-33043qualcomm, inc.snapdragon+197
EPSS score
0.09%
Transient DOS while handling PS event when Program Service name length offset value is set to 255.
6.8CVE-2024-33016qualcomm, inc.snapdragon+331
EPSS score
0.15%
memory corruption when an invalid firehose patch command is invoked.
8.4CVE-2024-33056qualcomm, inc.snapdragon+323
EPSS score
0.10%
Memory corruption when allocating and accessing an entry in an SMEM partition continuously.
7.5CVE-2024-33014qualcomm, inc.snapdragon+319
EPSS score
0.32%
Transient DOS while parsing ESP IE from beacon/probe response frame.
6.2CVE-2024-23357qualcomm, inc.snapdragon+236
EPSS score
0.09%
Transient DOS while importing a PKCS#8-encoded RSA key with zero bytes modulus.
7.8CVE-2024-23356qualcomm, inc.snapdragon+208
EPSS score
0.11%
Memory corruption during session sign renewal request calls in HLOS.
7.8CVE-2024-23368qualcomm, inc.snapdragon+341
EPSS score
0.10%
Memory corruption when allocating and accessing an entry in an SMEM partition.
7.5CVE-2024-23364qualcomm, inc.snapdragon+177
EPSS score
0.30%
Transient DOS when processing the non-transmitted BSSID profile sub-elements present within the MBSSID Information Element (IE) of a beacon frame that is received from over-the-air (OTA).
8.4CVE-2024-23373qualcomm, inc.snapdragon+220
EPSS score
0.15%
Memory corruption when IOMMU unmap operation fails, the DMA and anon buffers are getting released.
5.3CVE-2026-21370qualcomm, inc.snapdragon+90
EPSS score
0.08%
Memory Corruption when validating input batch size and buffer plane count exceeds maximum allowed values.
5.3CVE-2026-21384qualcomm, inc.snapdragon+79
EPSS score
0.08%
Memory Corruption when updating prepared commands with invalid port indices based on user space input exceeds supported read client limits.
5.3CVE-2026-21368qualcomm, inc.snapdragon+90
EPSS score
0.08%
Memory Corruption when parsing jpeg commands due to unaccounted extra writes to the buffer during validation checks.
7.8CVE-2026-21385qualcomm, inc.snapdragon+230KEV
EPSS score
1.29%
Memory corruption while using alignments for memory allocation.
5.3CVE-2026-21369qualcomm, inc.snapdragon+107
EPSS score
0.08%
Memory Corruption when handling flash commands due to outdated LED count values being used after userspace modification.
7.5CVE-2026-25275qualcomm, inc.snapdragon+369
EPSS score
0.19%
Transient DOS when processing authentication frames with invalid FILS information element header lengths.
6.7CVE-2026-25270qualcomm, inc.snapdragon+197
EPSS score
0.07%
Memory corruption when processing command buffer requests with invalid length parameters in the Android Camera driver.