Qualcomm Ssg2115P vulnerabilities

268 vulnerabilities

Known vulnerabilities in Qualcomm Ssg2115P, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

6.2CVE-2025-21433qualcomm, inc.snapdragon+268
EPSS score
0.09%
Transient DOS when importing a PKCS#8-encoded RSA private key with a zero-sized modulus.
6.5CVE-2025-21464qualcomm, inc.snapdragon+340
EPSS score
0.09%
Information disclosure while reading data from an image using specified offset and size parameters.
7.5CVE-2025-21454qualcomm, inc.snapdragon+185
EPSS score
0.24%
Transient DOS while processing received beacon frame.
7.5CVE-2025-21448qualcomm, inc.snapdragon+267
EPSS score
0.26%
Transient DOS may occur while parsing SSID in action frames.
7.8CVE-2025-21426qualcomm, inc.snapdragon+10
EPSS score
0.10%
Memory corruption while processing camera TPG write request.
7.8CVE-2025-21468qualcomm, inc.snapdragon+146
EPSS score
0.11%
Memory corruption while reading response from FW, when buffer size is changed by FW while driver is using this size to write null character at the end of buffer.
7.5CVE-2025-21446qualcomm, inc.snapdragon+235
EPSS score
0.24%
Transient DOS may occur when processing vendor-specific information elements while parsing a WLAN frame for BTM requests.
7.8CVE-2025-21432qualcomm, inc.snapdragon+239
EPSS score
0.09%
Memory corruption while retrieving the CBOR data from TA.
7.5CVE-2025-21459qualcomm, inc.snapdragon+123
EPSS score
0.34%
Transient DOS while parsing per STA profile in ML IE.
7.1CVE-2025-21482qualcomm, inc.snapdragon+287
EPSS score
0.09%
Cryptographic issue while performing RSA PKCS padding decoding.
7.5CVE-2025-21449qualcomm, inc.snapdragon+178
EPSS score
0.24%
Transient DOS may occur while processing malformed length field in SSID IEs.
7.5CVE-2025-21434qualcomm, inc.snapdragon+121
EPSS score
0.26%
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.
6.5CVE-2025-21465qualcomm, inc.snapdragon+347
EPSS score
0.09%
Information disclosure while processing the hash segment in an MBN file.
7.8CVE-2025-21422qualcomm, inc.snapdragon+215
EPSS score
0.10%
Cryptographic issue while processing crypto API calls, missing checks may lead to corrupted key usage or IV reuses.
7.5CVE-2025-21463qualcomm, inc.snapdragon+210
EPSS score
0.23%
Transient DOS while processing the EHT operation IE in the received beacon frame.
7.5CVE-2025-47318qualcomm, inc.snapdragon+202
EPSS score
0.21%
Transient DOS while parsing the EPTM test control message to get the test pattern.
7.8CVE-2025-47348qualcomm, inc.snapdragon+202
EPSS score
0.08%
Memory corruption while processing identity credential operations in the trusted application.
6.7CVE-2025-47334qualcomm, inc.snapdragon+144
EPSS score
0.08%
Memory corruption while processing shared command buffer packet between camera userspace and kernel.
7.8CVE-2025-47323qualcomm, inc.snapdragon+176
EPSS score
0.09%
Memory corruption while routing GPR packets between user and root when handling large data packet.
7.8CVE-2025-47397qualcomm, inc.snapdragon+144
EPSS score
0.11%
Memory Corruption when initiating GPU memory mapping using scatter-gather lists due to unchecked IOMMU mapping errors.