Qualcomm Wcd9390 vulnerabilities, page 2

376 vulnerabilities

Known vulnerabilities in Qualcomm Wcd9390, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

7.5CVE-2025-21435qualcomm, inc.snapdragon+149
EPSS score
0.26%
Transient DOS may occur while parsing extended IE in beacon.
7.5CVE-2025-21459qualcomm, inc.snapdragon+123
EPSS score
0.34%
Transient DOS while parsing per STA profile in ML IE.
9.8CVE-2025-21483qualcomm, inc.snapdragon+225
EPSS score
0.42%
Memory corruption when the UE receives an RTP packet from the network, during the reassembly of NALUs.
7.8CVE-2025-21485qualcomm, inc.snapdragon+29
EPSS score
0.08%
Memory corruption while processing INIT and multimode invoke IOCTL calls on FastRPC.
7.1CVE-2025-21482qualcomm, inc.snapdragon+287
EPSS score
0.09%
Cryptographic issue while performing RSA PKCS padding decoding.
7.5CVE-2025-21434qualcomm, inc.snapdragon+121
EPSS score
0.26%
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.
6.5CVE-2025-21465qualcomm, inc.snapdragon+347
EPSS score
0.09%
Information disclosure while processing the hash segment in an MBN file.
7.8CVE-2025-21422qualcomm, inc.snapdragon+215
EPSS score
0.10%
Cryptographic issue while processing crypto API calls, missing checks may lead to corrupted key usage or IV reuses.
7.8CVE-2025-21453qualcomm, inc.snapdragon+259
EPSS score
0.11%
Memory corruption while processing a data structure, when an iterator is accessed after it has been removed, potential failures occur.
7.5CVE-2025-21463qualcomm, inc.snapdragon+210
EPSS score
0.23%
Transient DOS while processing the EHT operation IE in the received beacon frame.
8.2CVE-2025-21488qualcomm, inc.snapdragon+106
EPSS score
0.27%
Information disclosure while decoding this RTP packet headers received by UE from the network when the padding bit is set.
5.5CVE-2025-59609qualcomm, inc.snapdragon+186
EPSS score
0.09%
Information Disclosure when processing advertisement frames with malformed MBSSID elements of insufficient length.
7.8CVE-2025-59600qualcomm, inc.snapdragon+162
EPSS score
0.08%
Memory Corruption when adding user-supplied data without checking available buffer space.
7.8CVE-2025-59604qualcomm, inc.snapdragon+258
EPSS score
0.07%
Memory Corruption when running a memory copy operation due to invalid writes caused by a null pointer.
6.4CVE-2025-59610qualcomm, inc.snapdragon+229
EPSS score
0.06%
Memory Corruption when processing IOCTL requests with mismatched API versions due to concurrent modification of user-space buffer.
7.8CVE-2025-59605qualcomm, inc.snapdragon+134
EPSS score
0.07%
Memory Corruption when processing device identifier strings that exceed the expected maximum length.
7.8CVE-2025-47376qualcomm, inc.snapdragon+165
EPSS score
0.07%
Memory Corruption when concurrent access to shared buffer occurs during IOCTL calls.
7.5CVE-2025-47318qualcomm, inc.snapdragon+202
EPSS score
0.21%
Transient DOS while parsing the EPTM test control message to get the test pattern.
7.8CVE-2025-47348qualcomm, inc.snapdragon+202
EPSS score
0.08%
Memory corruption while processing identity credential operations in the trusted application.
7.8CVE-2025-47379qualcomm, inc.snapdragon+173
EPSS score
0.07%
Memory Corruption when concurrent access to shared buffer occurs due to improper synchronization between assignment and deallocation of buffer resources.