Qualcomm Wcn6450 vulnerabilities, page 5

116 vulnerabilities

Known vulnerabilities in Qualcomm Wcn6450, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

9.8CVE-2024-49839qualcomm, inc.snapdragon+185
EPSS score
0.29%
Memory corruption during management frame processing due to mismatch in T2LM info element.
7.8CVE-2024-49845qualcomm, inc.snapdragon+144
EPSS score
0.11%
Memory corruption during the FRS UDS generation process.
7.8CVE-2024-49835qualcomm, inc.snapdragon+207
EPSS score
0.11%
Memory corruption while reading secure file.
6.7CVE-2024-49848qualcomm, inc.snapdragon+145
EPSS score
0.14%
Memory corruption while processing multiple IOCTL calls from HLOS to DSP.
7.8CVE-2024-49844qualcomm, inc.snapdragon+179
EPSS score
0.11%
Memory corruption while triggering commands in the PlayReady Trusted application.
7.8CVE-2024-49833qualcomm, inc.snapdragon+78
EPSS score
0.10%
Memory corruption can occur in the camera when an invalid CID is used.
7.5CVE-2024-33058qualcomm, inc.snapdragon+189
EPSS score
0.09%
Memory corruption while assigning memory from the source DDR memory(HLOS) to ADSP.
7.6CVE-2026-21381qualcomm, inc.snapdragon+102
EPSS score
0.15%
Transient DOS when receiving a service data frame with excessive length during device matching over a neighborhood awareness network protocol connection.
5.3CVE-2026-21370qualcomm, inc.snapdragon+90
EPSS score
0.08%
Memory Corruption when validating input batch size and buffer plane count exceeds maximum allowed values.
5.3CVE-2026-21368qualcomm, inc.snapdragon+90
EPSS score
0.08%
Memory Corruption when parsing jpeg commands due to unaccounted extra writes to the buffer during validation checks.
7.6CVE-2026-21367qualcomm, inc.snapdragon+149
EPSS score
0.20%
Transient DOS when processing nonstandard FILS Discovery Frames with out-of-range action sizes during initial scans.
7.8CVE-2026-21385qualcomm, inc.snapdragon+230KEV
EPSS score
1.29%
Memory corruption while using alignments for memory allocation.
5.3CVE-2026-21369qualcomm, inc.snapdragon+107
EPSS score
0.08%
Memory Corruption when handling flash commands due to outdated LED count values being used after userspace modification.
7.5CVE-2026-25275qualcomm, inc.snapdragon+369
EPSS score
0.19%
Transient DOS when processing authentication frames with invalid FILS information element header lengths.
6.7CVE-2026-25270qualcomm, inc.snapdragon+197
EPSS score
0.07%
Memory corruption when processing command buffer requests with invalid length parameters in the Android Camera driver.
7.1CVE-2026-25302qualcomm, inc.snapdragon+285
EPSS score
0.06%
Cryptographic Issue when processing non-ELF partitions, authentication and signature checks are bypassed, allowing unsigned or corrupted images to be mounted and processed.
6.7CVE-2026-25269qualcomm, inc.snapdragon+153
EPSS score
0.07%
Memory corruption when processing camera requests with excessive batch and IO buffer configurations exceeds allocated memory size.
7.4CVE-2026-25288qualcomm, inc.snapdragon+54
EPSS score
0.16%
Transient DOS when processing a short target wake time channel usage response frame with insufficient packet size.
7.8CVE-2026-25291qualcomm, inc.snapdragon+109
EPSS score
0.07%
Memory corruption when performing concurrent operations on shared memory page lists due to lack of proper synchronization mechanisms.
6.7CVE-2026-25273qualcomm, inc.snapdragon+51
EPSS score
0.07%
Memory Corruption when processing camera operations due to out-of-bounds write during driver updates.