Qualcomm Wcn7860 vulnerabilities

170 vulnerabilities

Known vulnerabilities in Qualcomm Wcn7860, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

8.2CVE-2025-21487qualcomm, inc.snapdragon+225
EPSS score
0.26%
Information disclosure while decoding RTP packet received by UE from the network, when payload length mentioned is greater than the available buffer length.
8.2CVE-2025-21484qualcomm, inc.snapdragon+173
EPSS score
0.26%
Information disclosure when UE receives the RTP packet from the network, while decoding and reassembling the fragments from RTP packet.
6.2CVE-2025-21433qualcomm, inc.snapdragon+268
EPSS score
0.09%
Transient DOS when importing a PKCS#8-encoded RSA private key with a zero-sized modulus.
6.5CVE-2025-21464qualcomm, inc.snapdragon+340
EPSS score
0.09%
Information disclosure while reading data from an image using specified offset and size parameters.
9.1CVE-2025-21450qualcomm, inc.snapdragon+104
EPSS score
0.32%
Cryptographic issue occurs due to use of insecure connection method while downloading.
7.8CVE-2025-21486qualcomm, inc.snapdragon+31
EPSS score
0.10%
Memory corruption during dynamic process creation call when client is only passing address and length of shell binary.
7.5CVE-2025-21448qualcomm, inc.snapdragon+267
EPSS score
0.26%
Transient DOS may occur while parsing SSID in action frames.
7.8CVE-2025-21436qualcomm, inc.snapdragon+25
EPSS score
0.11%
Memory corruption may occur while initiating two IOCTL calls simultaneously to create processes from two different threads.
7.8CVE-2025-21468qualcomm, inc.snapdragon+146
EPSS score
0.11%
Memory corruption while reading response from FW, when buffer size is changed by FW while driver is using this size to write null character at the end of buffer.
7.5CVE-2025-21446qualcomm, inc.snapdragon+235
EPSS score
0.24%
Transient DOS may occur when processing vendor-specific information elements while parsing a WLAN frame for BTM requests.
7.8CVE-2025-21476qualcomm, inc.snapdragon+42
EPSS score
0.09%
Memory corruption when passing parameters to the Trusted Virtual Machine during the handshake.
7.8CVE-2025-21432qualcomm, inc.snapdragon+239
EPSS score
0.09%
Memory corruption while retrieving the CBOR data from TA.
7.8CVE-2025-21481qualcomm, inc.snapdragon+249
EPSS score
0.07%
Memory corruption while performing private key encryption in trusted application.
7.5CVE-2025-21435qualcomm, inc.snapdragon+149
EPSS score
0.26%
Transient DOS may occur while parsing extended IE in beacon.
7.5CVE-2025-21459qualcomm, inc.snapdragon+123
EPSS score
0.34%
Transient DOS while parsing per STA profile in ML IE.
9.8CVE-2025-21483qualcomm, inc.snapdragon+225
EPSS score
0.42%
Memory corruption when the UE receives an RTP packet from the network, during the reassembly of NALUs.
7.8CVE-2025-21485qualcomm, inc.snapdragon+29
EPSS score
0.08%
Memory corruption while processing INIT and multimode invoke IOCTL calls on FastRPC.
7.1CVE-2025-21482qualcomm, inc.snapdragon+287
EPSS score
0.09%
Cryptographic issue while performing RSA PKCS padding decoding.
7.5CVE-2025-21434qualcomm, inc.snapdragon+121
EPSS score
0.26%
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.
6.5CVE-2025-21465qualcomm, inc.snapdragon+347
EPSS score
0.09%
Information disclosure while processing the hash segment in an MBN file.