Qualcomm Qca6787Aq vulnerabilities, page 2

40 vulnerabilities

Known vulnerabilities in Qualcomm Qca6787Aq, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

9.1CVE-2024-38408qualcomm, inc.snapdragon+229
EPSS score
0.14%
Cryptographic issue when a controller receives an LMP start encryption command under unexpected conditions.
7.5CVE-2024-45558qualcomm, inc.snapdragon+182
EPSS score
0.38%
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
9.8CVE-2024-45569qualcomm, inc.snapdragon+173
EPSS score
0.58%
Memory corruption while parsing the ML IE due to invalid frame content.
7.8CVE-2024-45571qualcomm, inc.snapdragon+150
EPSS score
0.10%
Memory corruption may occour occur when stopping the WLAN interface after processing a WMI command from the interface.
9.8CVE-2024-49839qualcomm, inc.snapdragon+185
EPSS score
0.29%
Memory corruption during management frame processing due to mismatch in T2LM info element.
8.2CVE-2024-49838qualcomm, inc.snapdragon+165
EPSS score
0.31%
Information disclosure while parsing the OCI IE with invalid length.
7.5CVE-2024-33069qualcomm, inc.snapdragon+44
EPSS score
0.36%
Transient DOS when transmission of management frame sent by host is not successful and error status is received in the host.
7.5CVE-2024-33068qualcomm, inc.snapdragon+121
EPSS score
0.25%
Transient DOS while parsing fragments of MBSSID IE from beacon frame.
7.5CVE-2024-33050qualcomm, inc.snapdragon+252
EPSS score
0.30%
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
7.5CVE-2024-33048qualcomm, inc.snapdragon+187
EPSS score
0.30%
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
7.5CVE-2024-33063qualcomm, inc.snapdragon+123
EPSS score
0.26%
Transient DOS while parsing the ML IE when a beacon with common info length of the ML IE greater than the ML IE inside which this element is present.
8.4CVE-2024-33056qualcomm, inc.snapdragon+323
EPSS score
0.10%
Memory corruption when allocating and accessing an entry in an SMEM partition continuously.
7.5CVE-2024-33057qualcomm, inc.snapdragon+170
EPSS score
0.30%
Transient DOS while parsing the multi-link element Control field when common information length check is missing before updating the location.
7.5CVE-2024-33049qualcomm, inc.snapdragon+131
EPSS score
0.32%
Transient DOS while parsing noninheritance IE of Extension element when length of IE is 2 of beacon frame.
7.5CVE-2024-23364qualcomm, inc.snapdragon+177
EPSS score
0.30%
Transient DOS when processing the non-transmitted BSSID profile sub-elements present within the MBSSID Information Element (IE) of a beacon frame that is received from over-the-air (OTA).
7.6CVE-2026-21381qualcomm, inc.snapdragon+102
EPSS score
0.15%
Transient DOS when receiving a service data frame with excessive length during device matching over a neighborhood awareness network protocol connection.
7.6CVE-2026-21367qualcomm, inc.snapdragon+149
EPSS score
0.20%
Transient DOS when processing nonstandard FILS Discovery Frames with out-of-range action sizes during initial scans.
7.5CVE-2026-25275qualcomm, inc.snapdragon+369
EPSS score
0.19%
Transient DOS when processing authentication frames with invalid FILS information element header lengths.
9.6CVE-2026-25289qualcomm, inc.snapdragon+199
EPSS score
0.19%
Memory Corruption when processing Device Capability Extended attributes in certain NAN Service Discovery Frames with invalid length values.
6.5CVE-2026-24077qualcomm, inc.snapdragon+139
EPSS score
0.17%
Information Disclosure when processing wireless network channel switch information with improperly formatted length fields.