Qualcomm Qcc2076 vulnerabilities

111 vulnerabilities

Known vulnerabilities in Qualcomm Qcc2076, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

7.5CVE-2025-21429qualcomm, inc.snapdragon+182
EPSS score
0.26%
Memory corruption occurs while connecting a STA to an AP and initiating an ADD TS request.
7.8CVE-2025-21440qualcomm, inc.snapdragon+49
EPSS score
0.11%
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
7.5CVE-2025-21430qualcomm, inc.snapdragon+223
EPSS score
0.26%
Transient DOS while connecting STA to AP and initiating ADD TS request from AP to establish TSpec session.
7.5CVE-2025-21448qualcomm, inc.snapdragon+267
EPSS score
0.26%
Transient DOS may occur while parsing SSID in action frames.
7.5CVE-2025-21446qualcomm, inc.snapdragon+235
EPSS score
0.24%
Transient DOS may occur when processing vendor-specific information elements while parsing a WLAN frame for BTM requests.
7.5CVE-2025-21435qualcomm, inc.snapdragon+149
EPSS score
0.26%
Transient DOS may occur while parsing extended IE in beacon.
7.5CVE-2025-21459qualcomm, inc.snapdragon+123
EPSS score
0.34%
Transient DOS while parsing per STA profile in ML IE.
7.5CVE-2025-21434qualcomm, inc.snapdragon+121
EPSS score
0.26%
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.
7.8CVE-2025-21441alpinepy3-urllib3+50
EPSS score
0.11%
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
7.5CVE-2025-21463qualcomm, inc.snapdragon+210
EPSS score
0.23%
Transient DOS while processing the EHT operation IE in the received beacon frame.
7.5CVE-2025-47318qualcomm, inc.snapdragon+202
EPSS score
0.21%
Transient DOS while parsing the EPTM test control message to get the test pattern.
6.5CVE-2025-47402qualcomm, inc.snapdragon+94
EPSS score
0.16%
Transient DOS when processing a received frame with an excessively large authentication information element.
6.5CVE-2025-47370qualcomm, inc.snapdragon+135
EPSS score
0.12%
Transient DOS when a remote device sends an invalid connection request during BT connectable LE scan.
7.5CVE-2025-47403qualcomm, inc.snapdragon+254
EPSS score
0.22%
Transient DOS when processing a malformed Fast Transition response frame with an invalid header structure during wireless roaming.
7.8CVE-2025-27051qualcomm, inc.snapdragon+10
EPSS score
0.10%
Memory corruption while processing command message in WLAN Host.
7.5CVE-2025-27073qualcomm, inc.snapdragon+169
EPSS score
0.22%
Transient DOS while creating NDP instance.
7.5CVE-2025-27057qualcomm, inc.snapdragon+210
EPSS score
0.25%
Transient DOS while handling beacon frames with invalid IE header length.
7.5CVE-2025-27065qualcomm, inc.snapdragon+149
EPSS score
0.22%
Transient DOS while processing a frame with malformed shared-key descriptor.
7.5CVE-2025-27066qualcomm, inc.snapdragon+370
EPSS score
0.28%
Transient DOS while processing an ANQP message.
7.5CVE-2024-21458qualcomm, inc.snapdragon+111
EPSS score
0.21%
Information disclosure while handling SA query action frame.