Qualcomm Qcc2076 vulnerabilities, page 2

111 vulnerabilities

Known vulnerabilities in Qualcomm Qcc2076, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

7.5CVE-2024-21466qualcomm, inc.snapdragon+64
EPSS score
0.21%
Information disclosure while parsing sub-IE length during new IE generation.
7.5CVE-2024-21477qualcomm, inc.snapdragon+182
EPSS score
0.32%
Transient DOS while parsing a protected 802.11az Fine Time Measurement (FTM) frame.
7.5CVE-2024-21457qualcomm, inc.snapdragon+111
EPSS score
0.21%
INformation disclosure while handling Multi-link IE in beacon frame.
7.5CVE-2024-21459qualcomm, inc.snapdragon+175
EPSS score
0.26%
Information disclosure while handling beacon or probe response frame in STA.
9.1CVE-2024-21456qualcomm, inc.snapdragon+42
EPSS score
0.27%
Information Disclosure while parsing beacon frame in STA.
7.5CVE-2024-21467qualcomm, inc.snapdragon+129
EPSS score
0.26%
Information disclosure while handling beacon probe frame during scan entry generation in client side.
7.8CVE-2024-43049qualcomm, inc.snapdragon+19
EPSS score
0.10%
Memory corruption while invoking IOCTL calls from user space to set generic private command inside WLAN driver.
7.8CVE-2024-43050qualcomm, inc.snapdragon+54
EPSS score
0.10%
Memory corruption while invoking IOCTL calls from user space to issue factory test command inside WLAN driver.
7.8CVE-2024-43053qualcomm, inc.snapdragon+20
EPSS score
0.10%
Memory corruption while invoking IOCTL calls from user space to read WLAN target diagnostic information.
7.5CVE-2024-53027qualcomm, inc.snapdragon+206
EPSS score
0.30%
Transient DOS may occur while processing the country IE.
7.5CVE-2024-38405qualcomm, inc.snapdragon+98
EPSS score
0.25%
Transient DOS while processing the CU information from RNR IE.
7.8CVE-2024-38409qualcomm, inc.snapdragon+25
EPSS score
0.10%
Memory corruption while station LL statistic handling.
7.5CVE-2024-38403qualcomm, inc.snapdragon+77
EPSS score
0.25%
Transient DOS while parsing BTM ML IE when per STA profile is not included.
9.1CVE-2024-38408qualcomm, inc.snapdragon+229
EPSS score
0.14%
Cryptographic issue when a controller receives an LMP start encryption command under unexpected conditions.
7.8CVE-2024-38410qualcomm, inc.snapdragon+25
EPSS score
0.10%
Memory corruption while IOCLT is called when device is in invalid state and the WMI command buffer may be freed twice.
7.8CVE-2024-45546qualcomm, inc.snapdragon+10
EPSS score
0.09%
Memory corruption while processing FIPS encryption or decryption IOCTL call invoked from user-space.
7.8CVE-2024-45547qualcomm, inc.snapdragon+10
EPSS score
0.07%
Memory corruption while processing IOCTL call invoked from user-space to verify non extension FIPS encryption and decryption functionality.
7.8CVE-2024-45542qualcomm, inc.snapdragon+51
EPSS score
0.13%
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
7.5CVE-2024-45558qualcomm, inc.snapdragon+182
EPSS score
0.38%
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
7.8CVE-2024-45548qualcomm, inc.snapdragon+10
EPSS score
0.09%
Memory corruption while processing FIPS encryption or decryption validation functionality IOCTL call.