Qualcomm Snapdragon 8C Compute Platform \(Sc8180Xp Ad\) vulnerabilities, page 2

40 vulnerabilities

Known vulnerabilities in Qualcomm Snapdragon 8C Compute Platform \(Sc8180Xp Ad\), newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

8.4CVE-2024-21481qualcomm, inc.snapdragon+165
EPSS score
0.11%
Memory corruption when preparing a shared memory notification for a memparcel in Resource Manager.
5.5CVE-2024-43046qualcomm, inc.snapdragon+308
EPSS score
0.11%
There may be information disclosure during memory re-allocation in TZ Secure OS.
7.8CVE-2024-53010qualcomm, inc.snapdragon+191
EPSS score
0.08%
Memory corruption may occur while attaching VM when the HLOS retains access to VM.
6.8CVE-2024-33016qualcomm, inc.snapdragon+331
EPSS score
0.15%
memory corruption when an invalid firehose patch command is invoked.
7.5CVE-2024-33058qualcomm, inc.snapdragon+189
EPSS score
0.09%
Memory corruption while assigning memory from the source DDR memory(HLOS) to ADSP.
8.4CVE-2024-33065qualcomm, inc.snapdragon+45
EPSS score
0.12%
Memory corruption while taking snapshot when an offset variable is set by camera driver.
7.5CVE-2024-23353qualcomm, inc.snapdragon+247
EPSS score
0.35%
Transient DOS while decoding attach reject message received by UE, when IEI is set to ESM_IEI.
7.1CVE-2024-23362qualcomm, inc.snapdragon+230
EPSS score
0.12%
Cryptographic issue while parsing RSA keys in COBR format.
8.2CVE-2024-23359qualcomm, inc.snapdragon+159
EPSS score
0.26%
Information disclosure while decoding Tracking Area Update Accept or Attach Accept message received from network.
7.8CVE-2026-21373qualcomm, inc.snapdragon+54
EPSS score
0.08%
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing.
7.8CVE-2026-21376qualcomm, inc.snapdragon+54
EPSS score
0.10%
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing in a camera sensor driver.
7.8CVE-2026-21374qualcomm, inc.snapdragon+54
EPSS score
0.11%
Memory Corruption when processing auxiliary sensor input/output control commands with insufficient buffer size validation.
7.8CVE-2026-21371qualcomm, inc.snapdragon+52
EPSS score
0.10%
Memory Corruption when retrieving output buffer with insufficient size validation.
7.8CVE-2026-21379qualcomm, inc.snapdragon+47
EPSS score
0.10%
Memory Corruption when allocating memory with sizes that exceed the maximum allowed value.
7.5CVE-2026-25275qualcomm, inc.snapdragon+369
EPSS score
0.19%
Transient DOS when processing authentication frames with invalid FILS information element header lengths.
7.8CVE-2026-25267qualcomm, inc.snapdragon+160
EPSS score
0.06%
Memory corruption when non-secure loader rewrites page tables before secure memory initialization.
6.6CVE-2026-25263qualcomm, inc.snapdragon+160
EPSS score
0.06%
Memory corruption while processing IOCTL command called from user space to the kernel with invalid parameters.
7.8CVE-2026-24075qualcomm, inc.snapdragon+43
EPSS score
0.06%
Memory Corruption when multiple threads issue concurrent IOCTL requests to the device control handler due to improper synchronization and race conditions.
6.5CVE-2026-24077qualcomm, inc.snapdragon+139
EPSS score
0.17%
Information Disclosure when processing wireless network channel switch information with improperly formatted length fields.
6.7CVE-2026-24076qualcomm, inc.snapdragon+52
EPSS score
0.11%
Memory Corruption when processing registry values with incorrect types using a direct query method.