Qualcomm, Inc. Snapdragon vulnerabilities, page 3

997 vulnerabilities

Known vulnerabilities in Qualcomm, Inc. Snapdragon, newest first, with CVSS severity, EPSS, KEV listings, ransomware use and the affected versions.

7.8CVE-2025-21474qualcomm, inc.snapdragon+45
EPSS score
0.09%
Memory corruption while processing commands from A2dp sink command queue.
7.8CVE-2025-21432qualcomm, inc.snapdragon+239
EPSS score
0.09%
Memory corruption while retrieving the CBOR data from TA.
7.8CVE-2025-21481qualcomm, inc.snapdragon+249
EPSS score
0.07%
Memory corruption while performing private key encryption in trusted application.
7.8CVE-2025-21460qualcomm, inc.snapdragon+36
EPSS score
0.11%
Memory corruption while processing a message, when the buffer is controlled by a Guest VM, the value can be changed continuously.
7.5CVE-2025-21435qualcomm, inc.snapdragon+149
EPSS score
0.26%
Transient DOS may occur while parsing extended IE in beacon.
7.8CVE-2025-21439qualcomm, inc.snapdragon+25
EPSS score
0.11%
Memory corruption may occur while reading board data via IOCTL call when the WLAN driver copies the content to the provided output buffer.
7.5CVE-2025-21459qualcomm, inc.snapdragon+123
EPSS score
0.34%
Transient DOS while parsing per STA profile in ML IE.
7.8CVE-2025-21443qualcomm, inc.snapdragon+36
EPSS score
0.11%
Memory corruption while processing message content in eAVB.
7.8CVE-2025-21462qualcomm, inc.snapdragon+13
EPSS score
0.11%
Memory corruption while processing an IOCTL request, when buffer significantly exceeds the command argument limit.
9.8CVE-2025-21483qualcomm, inc.snapdragon+225
EPSS score
0.42%
Memory corruption when the UE receives an RTP packet from the network, during the reassembly of NALUs.
7.8CVE-2025-21485qualcomm, inc.snapdragon+29
EPSS score
0.08%
Memory corruption while processing INIT and multimode invoke IOCTL calls on FastRPC.
7.8CVE-2025-21421qualcomm, inc.snapdragon+45
EPSS score
0.11%
Memory corruption while processing escape code in API.
7.8CVE-2025-21456qualcomm, inc.snapdragon+64
EPSS score
0.09%
Memory corruption while processing IOCTL command when multiple threads are called to map/unmap buffer concurrently.
7.8CVE-2025-21438qualcomm, inc.snapdragon+43
EPSS score
0.11%
Memory corruption while IOCTL call is invoked from user-space to read board data.
7.8CVE-2025-21445qualcomm, inc.snapdragon+27
EPSS score
0.10%
Memory corruption while copying the result to the transmission queue which is shared between the virtual machine and the host.
7.1CVE-2025-21482qualcomm, inc.snapdragon+287
EPSS score
0.09%
Cryptographic issue while performing RSA PKCS padding decoding.
7.5CVE-2025-21449qualcomm, inc.snapdragon+178
EPSS score
0.24%
Transient DOS may occur while processing malformed length field in SSID IEs.
7.5CVE-2025-21434qualcomm, inc.snapdragon+121
EPSS score
0.26%
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.
7.8CVE-2025-21437qualcomm, inc.snapdragon+31
EPSS score
0.11%
Memory corruption while processing memory map or unmap IOCTL operations simultaneously.
7.8CVE-2025-21469qualcomm, inc.snapdragon+20
EPSS score
0.09%
Memory corruption while processing image encoding, when input buffer length is 0 in IOCTL call.